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?2006 Fairchild Semiconductor Corporation
 www.fairchildsemi.com
FAN7529 Rev. 1.0.2
4  
Absolute Maximum Ratings
Stresses exceeding the absolute maximum ratings may damage the device. The device may not function or be opera-
ble above the recommended operating conditions and stressing the parts to these levels is not recommended. In addi-
tion, extended exposure to stresses above the recommended operating conditions may affect device reliability. The
absolute maximum ratings are stress ratings only. T
A
 = 25癈 unless otherwise specified.
Thermal Impedance
(1)
Note:
1. Regarding the test environment and PCB type, please refer to JESD51-2 and JESD51-10.
Symbol
Parameter
Value
Unit
V
CC
Supply Voltage
V
Z
V
I
OH
, I
OL
Peak Drive Output Current
+500/-800
mA
I
clamp
Driver Output Clamping Diodes V
O
>V
CC
 or V
O
<-0.3V
?0
mA
I
det
Detector Clamping Diodes
?0
mA
V
IN
Error Amplifier, MOT, CS Input Voltages
-0.3 to 6
V
T
J
Operating Junction Temperature
150
癈
T
A
Operating Temperature Range
-40 to 125
癈
T
STG
Storage Temperature Range
-65 to 150
癈
V
ESD_HBM
ESD Capability, Human Body Model
2.0
kV
V
ESD_MM
ESD Capability, Machine Model
300
V
V
ESD_CDM
ESD Capability, Charged Device Model
500
V
Symbol
Parameter
Value
Unit
?/DIV>
J?/DIV>
Thermal Resistance, Junction-to-Ambient
8-DIP
110
癈/W
8-SOP
150
癈/W
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